JPH0324603B2 - - Google Patents

Info

Publication number
JPH0324603B2
JPH0324603B2 JP15350383A JP15350383A JPH0324603B2 JP H0324603 B2 JPH0324603 B2 JP H0324603B2 JP 15350383 A JP15350383 A JP 15350383A JP 15350383 A JP15350383 A JP 15350383A JP H0324603 B2 JPH0324603 B2 JP H0324603B2
Authority
JP
Japan
Prior art keywords
spot light
scanning
dimensional
sensor
lens
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP15350383A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6044810A (ja
Inventor
Seiichiro Tamai
Masao Murata
Keiichi Kobayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP15350383A priority Critical patent/JPS6044810A/ja
Publication of JPS6044810A publication Critical patent/JPS6044810A/ja
Publication of JPH0324603B2 publication Critical patent/JPH0324603B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP15350383A 1983-08-22 1983-08-22 スポット光位置検出装置 Granted JPS6044810A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15350383A JPS6044810A (ja) 1983-08-22 1983-08-22 スポット光位置検出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15350383A JPS6044810A (ja) 1983-08-22 1983-08-22 スポット光位置検出装置

Publications (2)

Publication Number Publication Date
JPS6044810A JPS6044810A (ja) 1985-03-11
JPH0324603B2 true JPH0324603B2 (en]) 1991-04-03

Family

ID=15563977

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15350383A Granted JPS6044810A (ja) 1983-08-22 1983-08-22 スポット光位置検出装置

Country Status (1)

Country Link
JP (1) JPS6044810A (en])

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61259109A (ja) * 1985-05-13 1986-11-17 Matsushita Electric Ind Co Ltd 光学距離計
JPS6217606A (ja) * 1985-07-15 1987-01-26 Hitachi Zosen Corp 水中計測装置
JPH0625653B2 (ja) * 1985-12-03 1994-04-06 幸男 佐藤 形状計測方法及び装置
JPH02161302A (ja) * 1988-12-14 1990-06-21 Juki Corp 形状測定装置
JPH0726825B2 (ja) * 1990-09-14 1995-03-29 松下電工株式会社 形状認識装置

Also Published As

Publication number Publication date
JPS6044810A (ja) 1985-03-11

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